A metrological atomic force microscope system
نویسندگان
چکیده
منابع مشابه
A Large Range Metrological Atomic Force Microscope with Nanometer Uncertainty
A metrological atomic force microscope (AFM) with 50mm×50mm×2mm scan range has been designed and constructed. In this paper, the structure and preliminary results are introduced. The precise movement of the sample is driven by a piezoelectric motion stage and airbearing stage for different scanning range. Four multi-pass homodyne interferometers attached to the metrological frame measure the re...
متن کاملDesign of Fractional Order Sliding Mode Controller for Chaos Suppression of Atomic Force Microscope System
A novel nonlinear fractional order sliding mode controller is proposed to control the chaotic atomic force microscope system in presence of uncertainties and disturbances. In the design of the suggested fractional order controller, conformable fractional order derivative is applied. The stability of the scheme is proved by means of the Lyapunov theory based on conformable fractional order deriv...
متن کاملForce Spectroscopy with the Atomic Force Microscope
Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....
متن کاملForce-feedback High-speed Atomic Force Microscope
High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynamic behavior of individual biological and bio-relevant molecules at a molecular-level resolution under physiologically relevant time scales, which is the realization of a dream in life sciences. These high-speed imaging applications now extend to the cellular/bacterial systems with the use of a sm...
متن کاملScanned-cantilever atomic force microscope
We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Nano express
سال: 2021
ISSN: ['2632-959X']
DOI: https://doi.org/10.1088/2632-959x/abed5e